DTLee Scientific, LLC
Instrument integration—Data Acquisition—Data Analysis
About the Owner
David Lee has over 15 years experience in solving measurement and analysis problems in physics, chemistry, materials science, and neurophysiology. During this time he has designed, built, tested, and used specialty hardware and software tools to make difficult, low signal measurements in noisy environments. He holds two patents for quantifying small capacitance changes against large parasitic capacitance backgrounds and using this data to map film thickness with nanoscale lateral resolution.
His training includes a Ph.D. in experimental condensed matter physics from The Ohio State University and a M.S. in computational physics from San Jose State University.
His software experience includes extensive coding in C, C++, assembler, MATLAB, IDL, and Mathematica to solve a variety of data acquisition and analysis problems. In addition, He has experience as a UNIX systems administrator, and maintaining and developing scripts in perl, bsh, and csh.