DTLee Scientific, LLC

Publications

Jed Johnson, Andy Niehaus, Sylvain Nichols, David Lee, Justin Koespel, David Anderson, and John Lannutti. Electrospun PCL in Vitro: a Microstructural Basis for Mechanical Property Changes. J. Biomaterials Science. 20(467-481)2009.
Jeremy Gaumer, Aakrit Prasad, David Lee, John J. Lannutti. Structure-Function Relationships and Source-to-Ground Distance in Electrospun Polycaprolactone, Acta Biomaterialia. DOI 10.1016/j.actbio.2009.01.021 (2009).
D.T. Lee, J.P. Pelz, and Bharat Bhushan, Scanning capacitance microscopy for thin film measurements, Nanotechnology 17(1484-1491) 2006.
D.T. Lee, J.P. Pelz, and Bharat Bhushan, Instrumentation for direct, low frequency scanning capacitance microscopy, and analysis of position dependent stray capacitance, Review of Scientific Instruments 73(3525-3533) 2002.
D.T. Lee, J.P. Pelz, and Bharat Bhushan, Review of Scientific Instruments 73 (3525-3533) 2002 was selected for the October 7, 2002 issue of the Virtual Journal of Nanoscale Science & Technology. http://www.vjnano.org
D.T. Lee, A Hybrid Direct Simulation Monte Carlo and Molecular Dynamics Algorithm. Thesis for San Jose State University, Dept. of Physics. (1995).
J.E. Zengel, D.T. Lee, M.L.C. Van Veelen, and D.R. Mosier. Effects of Calcium Channel Blockers on Stimulation-Induced Changes in Transmitter Release at the Frog Neuromuscular Junction. Synapse. 15, pp. 251-262 (1993).

J.P. Pelz, D. T. Lee, Bharat Bhushan, US Patent Number 7,023,220 Method for measuring nm-scale tip-sample capacitance. awarded 4 April 2006
J.P. Pelz, D. T. Lee, Bharat Bhushan, US Patent Number 6,856,145 Direct, Low Frequency Capacitance Measurement for Scanning Capacitance Microscopy. awarded 15 Feb. 2005